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Article
Publication date: 2 May 2017

Maruti K. Rendale, S.N. Mathad and Vijaya Puri

The present communication aims to investigate the influence of cobalt substitution on the structural, mechanical and elastic properties of nickel–zinc ferrite thick films. The…

Abstract

Purpose

The present communication aims to investigate the influence of cobalt substitution on the structural, mechanical and elastic properties of nickel–zinc ferrite thick films. The changes observed in the crystallite size (D), lattice constant (a), texture coefficient [TC(hkl)] and mechanical and elastic properties of the thick films due to cobalt substitution have been reported systematically.

Design/methodology/approach

Ni–Zn ferrites with the stoichiometric formula Ni0.7−xCoxZn0.3Fe2O4 (where, x = 0, 0.04, 0.08, 0.12, 0.16 and 0.20) were synthesized via solution combustion technique using sucrose as the fuel and poly-vinyl-alcohol as the matrix material. The thick films of the ferrites were fabricated on alumina substrates by the screen printing method. The thickness of the films was 25 μm, as measured by the gravimetric method. The thick films were subjected to X-ray diffraction and Fourier transform infrared spectroscopy.

Findings

The detailed study of variation of lattice parameter (a), sintering density, micro-strain and elastic properties with cobalt (Co+2) substituted was carried out. The remarkable increase in lattice parameter (from 8.369 A° to 8.3825 A°), bulk density and average grain size (69-119 nm) with the cobalt content was due to larger ionic radius of Co2+ compared to Ni2+. Texture analysis [TC(hkl)] reveals all thick films have adequate grain growth in the (311) plane direction. The main absorption bands of spinel ferrite have appeared through infrared absorption spectra recorded in the range of 300-700 cm−1.

Originality/value

The variation in stiffness constants (for isotropic material, C11 = C12), longitudinal elastic wave (Vl), transverse elastic wave (Vt), mean elastic velocity (VMean), rigidity modulus (G), Poisson’s ratio(s) and Young’s modulus (E) with cobalt (Co+2) composition has been interpreted in terms of binding forces found.

Details

Microelectronics International, vol. 34 no. 2
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 20 January 2012

Shital Patil and Vijaya Puri

The purpose of this paper is to study properties of magnesium oxide and mixed magnesium oxide‐bismuth oxide thick films for application in tuned devices.

Abstract

Purpose

The purpose of this paper is to study properties of magnesium oxide and mixed magnesium oxide‐bismuth oxide thick films for application in tuned devices.

Design/methodology/approach

The effect of magnesium oxide and mixed magnesium oxide‐bismuth oxide thick films overlay of different thickness on Ag thick film microstrip rectangular patch antenna was investigated in the X band (8‐12 GHz). Using Ag thick film microstrip rectangular patch antenna the thick and mixed thick films was characterized by microwave properties such as resonance frequency, amplitude, bandwidth, quality factor and input impedance. Using the resonance frequency the permittivity of magnesium oxide and mixed magnesium oxide‐bismuth oxide thick films was measured.

Findings

Cubic structure of single magnesium oxide and monoclinic structure of bismuth oxide was present in mixed thick film. Also the morphology of single thick films was maintained in mixed thick film of magnesium oxide‐bismuth oxide. Due to overlay magnesium oxide and magnesium oxide‐bismuth oxide mixed thick films, change in resonance frequency shifts towards high frequency end was observed. Dielectric constant of magnesium oxide and mixed magnesium oxide‐bismuth oxide thick film calculated from resonance frequency decreased with increase in thickness.

Originality/value

The microwave properties using Ag thick film microstrip patch antenna due to overlay of magnesium oxide and mixed magnesium oxide‐bismuth oxide thick films have been reported for the first time. Thickness of overlay dependent tuning of the antenna has been achieved.

Article
Publication date: 31 July 2007

U.B. Lonkar and Vijaya Puri

This paper aims to study tuning effects on thick film microstripline due to ferrite thick film overlay.

Abstract

Purpose

This paper aims to study tuning effects on thick film microstripline due to ferrite thick film overlay.

Design/methodology/approach

The possibility of obtaining tuning characteristics in the Ku band microwave region in the absence of external magnetic field by a simple process of using NixZn1−xFe2O4 thick film and bulk as in‐touch overlay over Ag thick film microstripline was investigated. The microstripline is basically a non‐resonant component with high‐transmission at a large microwave frequency band. The ferrite was synthesized by precursor method and the thick films were deposited by screen printing.

Findings

It was found that tuning characteristics were observed and composition, thickness and precursor dependent changes occurred. The changes with composition are more prominent in the 14.5‐16.5 GHz range. Also, the ferrite thick film overlay produces a deep notch at 15.7 GHz. It is observed that the pellet overlay also makes the microstripline very dispersive with a high‐insertion loss in the 16‐17 GHz range. The presence of permeability‐related effects interfering with the normal propagation of the microstrip circuits might be causing the changes in the circuits.

Originality/value

Owing to the NixZn1−xFe2O4 overlay the simple microstripline can be tuned to have narrow band filter type of characteristics. Thick film NixZn1−xFe2O4 overlay gives the added advantage of planer configuration along with cost‐effectiveness in the absence of magnetic field.

Details

Microelectronics International, vol. 24 no. 3
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 26 April 2013

S.N. Mathad, R.N. Jadhav and Vijaya Puri

The purpose of this paper was to determine the complex permittivity of bismuth strontium manganites (Bi1−xSrxMnO3) in the 8‐12 GHz range by using perturbation of Ag thick film…

Abstract

Purpose

The purpose of this paper was to determine the complex permittivity of bismuth strontium manganites (Bi1−xSrxMnO3) in the 8‐12 GHz range by using perturbation of Ag thick film microstrip ring resonator (MSRR) due to superstrate of both bulk and thick film.

Design/methodology/approach

The BSM ceramics were synthesized by simple low cost solid state reaction method and their fritless thick films were fabricated by screen printing technique on alumina substrate. A comparison has been made between the X band response of Ag thick film microstrip ring resonator due to perturbation of bulk and thick film Bi1−xSrxMnO3 ceramic.

Findings

The bulk and thick film superstrate decreases the resonance frequency of MSRR. In this technique even minor change in the properties of superstrate material changes the MSRR response. Variation of strontium content also influences microwave conductivity and penetration depth of bulk and thick films.

Originality/value

The microwave complex permittivity decreases with increase in Sr content in bismuth manganite and it is higher for bulk as compared to its thick films. The superstrate on Ag thick film microstrip ring resonator is an efficient tool capable of detecting the composition dependent changes in microwave properties of ceramic bulk and thick films.

Details

Microelectronics International, vol. 30 no. 2
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 11 May 2010

S. Patil and Vijaya Puri

The purpose of this paper is to report the effect of bismuth oxide thick films of various thicknesses on the X band (8‐12 GHz) response of Ag thick film microstrip rectangular…

Abstract

Purpose

The purpose of this paper is to report the effect of bismuth oxide thick films of various thicknesses on the X band (8‐12 GHz) response of Ag thick film microstrip rectangular patch antenna.

Design/methodology/approach

The effect of bismuth oxide thick film overlay of different thickness on Ag thick film microstrip rectangular patch antenna was investigated in the X band (8‐12 GHz). The change in the resonance frequency, amplitude, band width, quality factor, and input impedance of the antenna were studied. Using the resonance frequency the permittivity and conductivity of bismuth oxide thick film was measured.

Findings

Thickness of Bi2O3 thick film overlay dependent changes in the patch antenna characteristics is obtained. The resonance frequency shifts to higher frequency end due to overlay. The input impedance decreases due to the overlay. The dielectric constant of bismuth oxide thick film calculated from shift in resonance frequency shows thickness dependent values.

Originality/value

The microwave permittivity and conductivity of Bi2O3 thick film have been reported for the first time using overlay on thick film patch antenna. Thickness of overlay dependent tuning of the antenna has been achieved.

Details

Microelectronics International, vol. 27 no. 2
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 1 April 2001

Sunit Rane and Vijaya Puri

In this paper studies on the lab formulated fritless silver thick film paste with two different binder compositions that have been used to fabricate λ/2 microstrip rejection…

Abstract

In this paper studies on the lab formulated fritless silver thick film paste with two different binder compositions that have been used to fabricate λ/2 microstrip rejection filter in the X and Ku band are reported. These have been compared with ESL (USA) paste and copper thin film metallization for the same circuit. The thick film circuits were overlayed with TiO2 thick film of different thickness and changes in the characteristics studied. In the X band, the Q of the filter improves with overlay and is also dependent on the Ag paste formulation, whereas in the Ku band there are no thick film paste dependent properties observed due to overlay. Thickness of overlay and metallization paste formulation dependent factors should be taken into consideration during fabrication of high density and multi‐layer microwave integrated circuits.

Details

Microelectronics International, vol. 18 no. 1
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 1 January 2008

B.B. Vhanakhande, S.V. Jadhav and Vijaya Puri

The purpose of this paper is to compare thick and thin film microstripline response to conducting overlay.

Abstract

Purpose

The purpose of this paper is to compare thick and thin film microstripline response to conducting overlay.

Design/methodology/approach

Study changes in transmission and reflection of both thick and thin film microstripline due to overlay of polyaniline (PANI) thin film on stainless steel and silver. PANI was deposited by electropolymerisation method using HCl and H2SO4.

Findings

Transmittance of both the thick and thin film microstripline decreases due to the PANI overlay and reflectance increases. Thin film microstripline is more sensitive to the type of conducting overlay than thick film microstripline. PANI deposited on silver is more absorbing than PANI deposited on stainless steel using HCl acid. The overlay makes the response of the microstripline more dispersive.

Originality/value

The increase in reflectance and decrease in transmittance can provide information about the type of overlay materials. There is need for newer materials which can replace traditional metals for microstrip components. PANI might serve this purpose.

Details

Microelectronics International, vol. 25 no. 1
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 31 July 2009

Vaishali Mane and Vijaya Puri

The purpose of this paper is to report on the Ku band microwave characteristics of moisture laden soya seeds using overlay technique.

Abstract

Purpose

The purpose of this paper is to report on the Ku band microwave characteristics of moisture laden soya seeds using overlay technique.

Design/methodology/approach

Ku band (13‐18 GHz) moisture dependent microwave permittivity, conductivity, penetration depth of moisture laden soybean (Glycine Max) using overlay on Ag thick film equilateral triangular patch antenna are studied. The change in the frequency response of the patch antenna due to change in moisture content of the soybean overlay has been used to obtain the various microwave properties.

Findings

The permittivities obtained are in the range expected of moisture laden soybean. As moisture content increases microwave dielectric constant, dielectric loss, and conductivity of soybean increases. Only the amplitude data have been used here.

Originality/value

Ku band characterization of soybean has been done using overlay technique. The thick film patch antenna is sensitive even to ∼4 percent moisture content in the overlay material. This can be used for even moisture sensing at low moisture levels. This paper is believed to be an original research report.

Details

Microelectronics International, vol. 26 no. 3
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 1 April 2005

Vijaya Puri, S.M. Salunkhe and M.M. Puranik

Use of thin film microstrip patch antenna for leaf moisture studies.

Abstract

Purpose

Use of thin film microstrip patch antenna for leaf moisture studies.

Design/methodology/approach

In this paper, the studies on the effect of leaf used as in‐touch overlay on thin film microstrip patch antenna in the X band (8‐12 GHz) is reported. The patch was used as the transmitting antenna and a pyramidal horn antenna was the receiving antenna. Three leaves Furcarea Gigantea, Kalanchoe Pinnata and Cereus Prerogonus have been used as overlay. All these leaves have high chlorophyll content, but are different in their surface texture and rate of moisture loss.

Findings

Size of leaf, orientation with respect to direction of propagation and moisture content dependent changes in the patch antenna output are observed. When the size of the overlay is larger than the patch and the feedline is in contact with it, frequency changes are more, whereas when only patch is in contact with the leaf, amplitude changes are more. Thin film microstrip antenna can provide a means for sensing moisture content in leafy vegetation.

Originality/value

The study of moisture effects of leafy vegetation using the technique of in‐touch overlay on microstrip components can be used to generate data base about the plant conditions in various places.

Details

Microelectronics International, vol. 22 no. 1
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 18 January 2013

P.B. Kashid, D.C. Kulkarni, V.G. Surve and Vijaya Puri

The purpose of this paper is to study thickness dependent variation in microwave properties of the MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films and enhancement of power…

Abstract

Purpose

The purpose of this paper is to study thickness dependent variation in microwave properties of the MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films and enhancement of power efficiency of Ag thick film EMC patch antenna.

Design/methodology/approach

X‐band microwave properties of the MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films were measured by superstrate technique using Ag thick film EMC patch antenna as the resonant element. The complex permittivity and permeability of these thick films were also measured by this technique. The microwave response of the EMC patch, complex permeability and permittivity of Mg0.8Mn0.1Al0.1Zn0.8Fe1.2O4 and Mg0.9Al0.1Zn0.8Fe1.2O4 thick films and their thickness dependency were investigated.

Findings

The XRD patterns reveal the cubic spinel crystal system was obtained for both compositions. The crystallite size obtained was 134.68 nm for Mg0.8Mn0.1Al0.1Zn0.8Fe1.2O4 and 155.99 nm for Mg0.9Al0.1Zn0.8Fe1.2O4 The superstrate technique has been used successfully to evaluate the complex permittivity and permeability of the ferrite thick films in the X band. The EMC patch also show thickness and composition dependent frequency agility and enhancement of power efficiency.

Originality/value

The complex permeability of MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films measured by superstrate technique is reported in this paper. The superstrate of MgxMn(0.9−x)Al0.1Zn0.8Fe1.2O4 (x=0.8, 0.9) thick films makes the Ag thick film EMC patch antenna frequency agile and power amplification is obtained.

Details

Microelectronics International, vol. 30 no. 1
Type: Research Article
ISSN: 1356-5362

Keywords

1 – 10 of 24